The absence of a well-defined data management approach can cripple your testing and test automation, significantly reducing pre-release defect yield. Many teams invest lots of time and money managing test data and still do not achieve their goals for test coverage and quality. Test data challenges include test data creation, privacy masking, management, maintenance, replication, security, quality, scalability, and reusability. Chip Groder presents an engaging and interactive discussion on the critical factors for managing test data, including developing a defined test data strategy, ways...Learn More
Chip Groder
Intervise Consultants Inc.
Senior test architect Chip Groder has more than thirty years of experience in software development, software testing, and software quality. Chip has helped multiple Fortune 1000 organizations achieve success with test automation by defining test automation architectures; assisting with the creation, selection, and implementation of test automation frameworks; and training and mentoring individuals and teams in the art and science of automating tests. Chip is an expert in keyword-based test design and has experience with dozens of test tools. In his leisure time he is usually in his shop restoring an old John Deere tractor or out riding his horse.