Dell EMC is driving to optimize and reimagine their testing practices with the application of data-driven smart assistants, powered by analytics and machine learning. At a macro level, Geoff Meyer will highlight the opportunities across the product engineering and testing landscapes that are ripe for the application of analytics and AI. Key ingredients in moving toward solutions that matter are the identification of organization-specific pain points, their prioritization, and the availability and cleanliness of essential data. Geoff will share the process of experimentation, staffing, and...
Geoff Meyer
Geoff Meyer is a test architect in the Dell EMC Infrastructure Solutions Group and has thirty-five years of industry experience as a software developer, manager, program manager, and director. He drives the test strategy and architecture for over four hundred software and hardware testers across India, Taiwan, and the United States, which includes initiatives for agile testing, test automation, continuous testing, infrastructure as a service (IaaS), analytics, and machine learning. Geoff is a member of the Agile Austin community and frequent speaker at international agile and testing conferences. He is a board member of the Veterans4Quality.org 501(c)(3) and is a mentor and instructor to veterans participating in the program, which provides them an on-ramp to a career in software quality assurance. You can connect with Geoff on LinkedIn or Twitter.