Defect or Incident Management
Concurrent Sessions
T7 Avoid Testing Mistakes or Really Bad Things Can Happen
Bart Knaack, Professional Testing
Thu, 05/07/2015 - 11:15am
T8 Predict Defects with Data Mining and Machine Learning
Stephen Frein, Comcast
Thu, 05/07/2015 - 11:15am
T12 Continuous Test Improvement in a Rapidly Changing World
Martin Pol, Polteq Testing Services BV
Thu, 05/07/2015 - 11:15am
T13 What Do Defects Really Cost? Much More Than You Think
Wayne Ariola, Parasoft
Thu, 05/07/2015 - 1:30pm