Conference archive

  1. Home
  2. Program
  3. Tutorial
  4. Test Attack Patterns for Mobile, IoT, and Embedded Software

SEE PRICING & PACKAGES

Tuesday, April 19, 2016 - 1:00pm to 4:30pm
Half-day Tutorials

Test Attack Patterns for Mobile, IoT, and Embedded Software

Mobile/IoT/embedded software teams are looking for ways to speed up development, testing, and deployment of products that wow users but don’t blow up in their faces. In the tradition of James Whittaker’s book series How to Break Software, Jon Hagar applies the “attack” pattern concept to identify and test for potential failures in these types of systems. Jon defines the environments of mobile, IoT, and embedded software, and examines common software failures found in hardware/software systems. He shares a set of patterns you can apply during pre-production testing or in a continuous test and delivery—DevOps—environment. Based on common modes of failure, the patterns are not “cookbook processes” but must be customized for particular contexts. With select context examples, Jon explains when, who, and how to conduct the pattern. Attack patterns will cover developer testing, continuous integration, deployment for trusted bases, hardware/software test attacks, and security. Teams will be able to apply these patterns immediately to evolve local practices and avoid team silos. Attendees can practice attacks on devices containing mobile, IoT, and/or embedded software―so bring your smart devices and phones.

NOTE: To practice attacks, participants can either use devices that Jon will provide or their smartphones.

Embedded Testing
IoT Testing
Mobile Testing
Security Testing
Security
Software Tester
Jon_Hagar

Jon Hagar

Grand Software Testing

Jon Hagar is a systems software engineer and testing consultant, supporting software product integrity and verification and validation (V&V), with a specialization in mobile and embedded software system testing. For more than thirty years, Jon has worked in software testing and engineering projects. He authored Software Test Attacks to Break Mobile and Embedded Devices; consults, presents, teaches, and writes regularly in many forums on software testing and V&V; and is lead editor/author on committees including OMG UTP model-based test standard, IEEE 1012 V&V plans, and ISO/IEEE/IEC 29119 software test standard. Contact Jon at [email protected].