Conference archive

SEE PRICING & PACKAGES

Thursday, April 21, 2016 - 2:00pm to 2:45pm

Implement Combinatorial Test Patterns for Better Mobile and IoT Testing

A common problem in mobile and IoT systems is the large number and combinations of hardware, operational, and software configurations that need to be tested. For example, the so-called Android fragmentation problem might lead a test team to test hundreds of device and several software configurations, potentially yielding thousands or even tens of thousands of tests. Combinatorial testing, a technique involving mathematics and specific tooling, allows teams to reduce the number of test cases, while still assuring good error finding capabilities. Jon Hagar examines test combinatorial patterns supported by tools that will help you speed up testing these many configurations and use for other test tasks, too. During this session Jon will identify and demonstrate specific tools to solve real-world mobile and IoT testing problems. Take back reference materials and data to help your team justify adding combinatorial testing to its toolkit and regular testing activities.

Jon_Hagar
Grand Software Testing

Jon Hagar is a systems software engineer and testing consultant, supporting software product integrity and verification and validation (V&V), with a specialization in mobile and embedded software system testing. For more than thirty years, Jon has worked in software testing and engineering projects. He authored Software Test Attacks to Break Mobile and Embedded Devices; consults, presents, teaches, and writes regularly in many forums on software testing and V&V; and is lead editor/author on committees including OMG UTP model-based test standard, IEEE 1012 V&V plans, and ISO/IEEE/IEC 29119 software test standard. Contact Jon at [email protected].